The ambitious
multiscale materials modeling framework will be validated through systematic
materials characterization. In situ and post situ methods will be use
to characterize the film including residual stress, film chemistry and
texture. Characterization of film behavior will focus on domain wall
structure and mobility, domain pattern formation and evolution, and
electro-mechanical response as well as failure and fatigure. This will
be accomplished through accurate electromechanical testing with innovative
MEMS-based devices, complemented with in situ observations of domain
walls and patterns through Electrostatic Force Microscopy, Transmission
Electron Microscopy and Polarized Optical Microscopy.
