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The ambitious multiscale materials modeling framework will be validated through systematic materials characterization. In situ and post situ methods will be use to characterize the film including residual stress, film chemistry and texture. Characterization of film behavior will focus on domain wall structure and mobility, domain pattern formation and evolution, and electro-mechanical response as well as failure and fatigure. This will be accomplished through accurate electromechanical testing with innovative MEMS-based devices, complemented with in situ observations of domain walls and patterns through Electrostatic Force Microscopy, Transmission Electron Microscopy and Polarized Optical Microscopy.




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